Metrology, Inspection & 3D Scanning
Essential inspection and measurement solutions for AM parts.
Melotte implements data-capturing system to support semiconductor component production with Additive Center & amsight
By
Sam Davies
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Plastometrex launches MultiScale capability to capture high-resolution mechanical property variation
By
TCT Team
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US Navy funds Senvol to demonstrate capabilities of machine learning software on DED parts
By
Sam Davies
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ASTM AM CoE leading effort to connect technology outcomes to real-world industrial use
By
Sam Davies
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Plastometrex leads development of ASTM standard for Profilometry-based Indentation Plastometry technology
By
Sam Davies
/